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Use cases/Use case/Engraving on a tilted surface
Use case · 3D Top-Hat

Robust engraving and polishing across depth, even on a tilted surface.

Fine laser engraving and polishing lives and dies by surface quality. As soon as a feature spans a range of depths, the industry’s problem is holding onto that quality without stepping through different Z positions. A flat-top that stays in shape through the depth of focus makes it possible in a single scan. To benchmark it, we ran a deliberately hard case with our partner LANG: a 10 × 10 mm surface tilted by ~8° (1.34 mm height difference), and a far larger area stayed in spec in one pass.

Product: 3D Top-Hat Application: Engraving & polishing Setup: F100 mm · 1030 nm · fs Partner: LANG
Challenge
  • Fine engraving & polishing needs high surface quality across features that sit at different depths, ideally in one scan, without re-focusing to several Z positions
  • A conventional top-hat holds spec over only a small focus window, so anything off the focal plane falls out of spec
  • Benchmark case: a 10 × 10 mm surface tilted ~8° (1.34 mm height difference), a controlled stand-in for that depth spread, on an F100 mm scanner at 1030 nm, fs pulses
Result
  • >3× larger process window — a much larger stable region across the tilt
  • >2× better surface quality — Sa 0.4 µm vs. 0.9 µm, Sz 2.6 µm vs. 5.8 µm
  • Polished Z-regime ~530 µm vs. ~180 µm for a standard top-hat
Robust processing under production conditions: the tilted part stays in spec over a far larger area, with a visibly finer polished finish.
Setup & conditions: engraving & polishing on a tilted surface with LANG; 10 × 10 mm, 1.34 mm height difference, F100 mm, 1030 nm, fs.
3D Top-Hat vs. standard top-hat on the same tilted part: the in-spec (OK) polished band is far larger for the 3D Top-HatSide-by-side photographs of a tilted engraved surface: with the 3D Top-Hat a large central band is polished and marked OK, while with a standard 2D top-hat only a thin band at the z0 position is in spec
3D Top-Hat vs. standard top-hat

The numbers on a tilted surface

>3× process window

Polished Z-regime ~530 µm vs. ~180 µm for a standard top-hat, a far larger stable region across the tilt.

>2× surface quality

Roughness Sa 0.4 µm vs. 0.9 µm and Sz 2.6 µm vs. 5.8 µm, a measurably finer polished finish.

Robust in production

The same recipe holds across the height variation of a tilted part: fewer re-runs, more predictable quality.

Measured with LANG on a 10 × 10 mm part with 1.34 mm height difference. Values are configuration-specific and confirmed per setup.

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